Testing the data framework for an AI algorithm in preparation for high data rate X-ray facilities.
Hongwei ChenSathya R. ChitturiRajan PlumleyLingjia ShenNathan C. DruckerNicolas BurdetCheng PengSougata MardanyaDaniel RatnerAashwin MishraChun Hong YoonSanghoon SongMatthieu CholletGilberto FabbrisMike DunneSilke NelsonMingda LiAaron LindenbergChunjing JiaYoussef NashedArun BansilSugata ChowdhuryAdrian E. FeiguinJoshua J. TurnerJana ThayerPublished in: XLOOP@SC (2022)