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Special Issue on Critical Reliability Challenges and Practices [Guest Editorial].

Hoang Pham
Published in: IEEE Trans. Syst. Man Cybern. Part A (2007)
Keyphrases
  • special issue
  • international journal
  • lessons learned
  • case study
  • ai edam
  • applied intelligence
  • ecml pkdd
  • special section
  • knowledge base
  • design principles
  • evaluation methodologies