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Automatic Electroencephalogram Artifact Removal Using Deep Convolutional Neural Networks.

Fábio LopesAdriana LealJulio MedeirosMauro PintoAntónio DouradoMatthias DümpelmannCésar Teixeira
Published in: IEEE Access (2021)
Keyphrases
  • convolutional neural networks
  • fully automatic
  • semi automatic
  • convolutional network
  • real world
  • databases
  • deep learning
  • brain activity
  • healthy subjects