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Lifetime prediction and analysis of AlGaN/GaN HEMT devices under temperature stress.
Baozhu Wang
Jinyuan Zhao
Ming Zhang
Lin Yang
Jianchao Wang
Weimin Hou
Published in:
Microelectron. J. (2022)
Keyphrases
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prediction accuracy
databases
learning environment
data analysis
image analysis
quantitative analysis
neural network
real world
decision trees
case study