Towards fully automated testing and characterization for photonic compact modeling on 300-mm wafer platform.

Abdelsalam Aboketaf Crystal Hedges Vishal Dhurgude Brendan Harris Fen Guan Frank Pavlik Ted Anderson Andy Stricker Yusheng Bian Michal Rakowski Arunima Dasgupta Andrea Paganini

Published in: OFC (2021)

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