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A run-time built-in approach of TID test in SRAM based FPGAs.
Ning Ma
Shaojun Wang
Datong Liu
Yu Peng
Published in:
Microelectron. Reliab. (2016)
Keyphrases
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general purpose
power consumption
data sets
real time
computer vision
image processing
low cost
real world
information systems
expert systems
low power