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A run-time built-in approach of TID test in SRAM based FPGAs.

Ning MaShaojun WangDatong LiuYu Peng
Published in: Microelectron. Reliab. (2016)
Keyphrases
  • general purpose
  • power consumption
  • data sets
  • real time
  • computer vision
  • image processing
  • low cost
  • real world
  • information systems
  • expert systems
  • low power