Analytical modelling and parameters extraction of multilayered OLED.

Shubham Negi Poornima Mittal Brijesh Kumar

Published in: IET Circuits Devices Syst. (2019)

Keyphrases

information extraction
databases
neural network
maximum likelihood
sensitivity analysis
parameter space
automatic extraction
machine learning
information systems
image processing
markov random field
parameter estimation
parameter values
parameter tuning
measured data