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Novel Strategies for Highly Uniform and Reliable Cell Characteristics of 8th Generation 1Tb 3D-NAND Flash Memory.

Changhwan LeeMin-Tai YuSejun ParkHoki LeeBio KimSuhwan LimJaeduk LeeSung-Hun LeeMincheol ParkSujin AhnSunghoi Hur
Published in: VLSI Technology and Circuits (2023)
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