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Measurement of the Resistor Load Effect Using the Combined Quantum Hall Resistance.

Zhenyu YangYunfeng LuJianting ZhaoHongxing YangQing He
Published in: IEEE Trans. Instrum. Meas. (2023)
Keyphrases
  • artificial neural networks
  • load balancing
  • quantum computing
  • high speed
  • machine learning
  • computer vision
  • feature selection
  • image segmentation
  • negative impact