Statistical risk analysis for classification and feature extraction by multilayer perceptrons.
Chanchal ChatterjeeVwani P. RoychowdhuryPublished in: ICNN (1996)
Keyphrases
- feature extraction
- risk analysis
- multilayer perceptron
- feature vectors
- support vector machine svm
- pattern recognition
- machine learning
- feature selection
- risk management
- feature space
- neural network
- decision trees
- risk assessment
- artificial neural networks
- radial basis function
- support vector machine
- radial basis function network
- text classification
- back propagation
- statistical analysis
- decision making
- statistical models
- machine learning methods
- machine learning algorithms
- belief networks
- computational complexity
- generalization ability
- support vector
- data mining