Bayesian degradation modeling for reliability prediction of organic light-emitting diodes.

Suk Joo Bae Tao Yuan Seong-Joon Kim

Published in: J. Comput. Sci. (2016)

Keyphrases

light emitting diodes
light emitting
video camera
prediction accuracy
maximum likelihood
posterior probability
neural network
bayesian networks
low cost
missing data
prediction algorithm
models built