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Bayesian degradation modeling for reliability prediction of organic light-emitting diodes.

Suk Joo BaeTao YuanSeong-Joon Kim
Published in: J. Comput. Sci. (2016)
Keyphrases
  • light emitting diodes
  • light emitting
  • video camera
  • prediction accuracy
  • maximum likelihood
  • posterior probability
  • neural network
  • bayesian networks
  • low cost
  • missing data
  • prediction algorithm
  • models built