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Design and Analysis of Soft Error Rate in FET/CNTFET Based Radiation Hardened SRAM Cell.

Bharathi Raj MuthuEwins Pon PushpaVaithiyanathan DhandapaniKamala JayaramanHemalatha VasanthakumarWon-Chun OhSuresh Sagadevan
Published in: Sensors (2022)
Keyphrases
  • error rate
  • test set
  • misclassification rate
  • user interface
  • design process
  • support vector
  • pattern recognition
  • probabilistic model
  • x ray
  • support vector machine
  • infrared