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A Method for Detecting Surface Defects in Insulators Based on RPCA.

Wei HuHongyu QiZhenbing ZhaoLeilei Xu
Published in: ICIG (2) (2017)
Keyphrases
  • cost function
  • similarity measure
  • objective function
  • high accuracy
  • clustering method
  • neural network
  • preprocessing
  • pairwise
  • vision system
  • real time
  • image sequences