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Techniques for On-Chip Process Voltage and Temperature Detection and Compensation.

Qadeer Ahmad KhanG. K. SiddharthaDivya TripathiSanjay Kumar WadhwaKulbhushan Misri
Published in: VLSI Design (2006)
Keyphrases
  • high speed
  • detection method
  • anomaly detection
  • process model
  • computer vision
  • object detection
  • low cost
  • electric field