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Unsupervised Pre-Training of Imbalanced Data for Identification of Wafer Map Defect Patterns.
Ho-Sun Shon
Erdenebileg Batbaatar
Wan-Sup Cho
Seong Gon Choi
Published in:
IEEE Access (2021)
Keyphrases
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imbalanced data
supervised learning
ensemble methods
training set
unsupervised learning
support vector machine
linear regression
sampling methods
training examples
class imbalance
feature space
multi class
semi supervised
training samples
random forest