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at λ=543 nm.

Long Sheng MaSusanne PicardMassimo ZuccoJean-Marie ChartierLennart RobertssonPetr BallingPetr KrinJin QianZhongyou LiuChunying ShiMiguel Viliesid AlonsoGan XuSiew Leng TanKaj NyholmJes HenningsenJan HaldWilliam R. C. RowleyGeoffrey P. BarwoodRobert Windeler
Published in: IEEE Trans. Instrum. Meas. (2006)
Keyphrases
  • data sets
  • pattern recognition
  • high speed