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Method to extract parameters of power law for nano-scale SiON pMOSFETs under negative bias temperature instability.

Yeohyeok YunGang-Jun KimJi-Hoon SeoDonghee SonBongkoo Kang
Published in: Microelectron. Reliab. (2018)
Keyphrases
  • sensitivity analysis
  • power law
  • detection method
  • web pages
  • objective function
  • probabilistic model
  • parameter space
  • fine tuning
  • image segmentation
  • significant improvement
  • positive and negative