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Feature Analysis Using Millimeter-Wave Real Beam and Doppler Beam Sharpening Techniques.

Mary L. CassabaumJeffrey J. RodríguezJack G. RiddleDonald E. Waagen
Published in: SSIAI (2002)
Keyphrases
  • feature analysis
  • millimeter wave
  • face recognition
  • image data
  • signal processing
  • gray level
  • experimental data