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Total ionizing dose hardness analysis of transistors in commercial 180 nm CMOS technology.
Mukesh Kumar
Jagpal Singh Ubhi
Sanjeev Basra
Anuj Chawla
H. S. Jatana
Published in:
Microelectron. J. (2021)
Keyphrases
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cmos technology
low power
power consumption
image analysis
real time
spl times