Automatisierter funktionaler Steuergerätetest mit der EXtended Automation Method (EXAM).
Dirk ZitterellSebastian ThielPublished in: GI Jahrestagung (2) (2010)
Keyphrases
- objective function
- clustering method
- high accuracy
- high precision
- similarity measure
- preprocessing
- cost function
- experimental evaluation
- detection method
- theoretical analysis
- prior knowledge
- significant improvement
- computational cost
- error rate
- fully automatic
- support vector machine svm
- data sets
- classification accuracy
- k means
- artificial neural networks
- pairwise
- computational complexity
- video sequences
- feature extraction
- neural network