Impact of etch angles on cell characteristics in 3D NAND flash memory.
Young-Taek OhKyu-Beom KimSang-Hoon ShinHahng SimNguyen Van ToanTakahito OnoYunheub SongPublished in: Microelectron. J. (2018)
Keyphrases
- data mining
- flash memory
- garbage collection
- buffer management
- solid state
- random access
- file system
- embedded systems
- disk drives
- main memory
- secondary storage
- database systems
- data storage
- small size
- storage devices
- b tree
- storage management
- hand held devices
- memory management
- artificial intelligence
- general purpose
- data sets
- feature selection
- storage systems