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Strain dependence of piezoelectric coefficients for pseudomorphically grown semiconductors.

Raman GargVesel HaxhaMax A. MiglioratoAdrien HueG. P. SrivastavaThomas Hammerschmidt
Published in: Microelectron. J. (2009)
Keyphrases
  • high voltage
  • wavelet coefficients
  • magnetic field
  • finite element analysis
  • linear combination
  • image processing
  • social networks
  • image registration
  • denoising
  • reconstruction error
  • wavelet packet