Wideband measurement method for prognosis of soldering failure on electronic boards.
Francesco AdamoGregorio AndriaAttilio Di NisioNicola GiaquintoValeria L. ScaranoMaurizio SpadavecchiaPublished in: I2MTC (2014)
Keyphrases
- dynamic programming
- objective function
- computational cost
- significant improvement
- cost function
- high accuracy
- detection algorithm
- clustering method
- synthetic data
- prior knowledge
- k means
- pairwise
- experimental evaluation
- similarity measure
- classification accuracy
- theoretical analysis
- classification method
- machine learning methods
- optimization method