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Wideband measurement method for prognosis of soldering failure on electronic boards.
Francesco Adamo
Gregorio Andria
Attilio Di Nisio
Nicola Giaquinto
Valeria L. Scarano
Maurizio Spadavecchia
Published in:
I2MTC (2014)
Keyphrases
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dynamic programming
objective function
computational cost
significant improvement
cost function
high accuracy
detection algorithm
clustering method
synthetic data
prior knowledge
k means
pairwise
experimental evaluation
similarity measure
classification accuracy
theoretical analysis
classification method
machine learning methods
optimization method