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Two Novel Approaches for Identification of Synchronous Machine Parameters From Short-Circuit Current Waveform.

Mihailo MicevMartin P. CalasanShady H. E. Abdel AleemHany M. HasanienDragan S. Petrovic
Published in: IEEE Trans. Ind. Electron. (2022)
Keyphrases
  • short circuit
  • thin film
  • maximum likelihood
  • neural network
  • simulation model
  • real time
  • computer vision
  • pattern recognition
  • multi objective
  • frequency domain
  • experimental data
  • parameter values