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Efficient Multiple Instance Metric Learning Using Weakly Supervised Data.
Marc T. Law
Yaoliang Yu
Raquel Urtasun
Richard S. Zemel
Eric P. Xing
Published in:
CVPR (2017)
Keyphrases
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data sets
weakly supervised
metric learning
prior knowledge
computer vision
data analysis
fully supervised
machine learning
data points
information extraction
background knowledge