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Impact of GigaRad Ionizing Dose on 28 nm bulk MOSFETs for future HL-LHC.

Alessandro PezzottaC.-M. ZhangFarzan JazaeriClaudio BruschiniGiulio BorghelloF. FaccioS. MattiazzoAndrea BaschirottoChristian C. Enz
Published in: ESSDERC (2016)
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