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Optical Measurement of the Dynamic Contact Process of a MEMS Inertial Switch Under High Shock Loads.

Yun CaoZhanwen XiPingxin YuJiong WangWeirong Nie
Published in: IEEE Trans. Ind. Electron. (2017)
Keyphrases
  • long period
  • decision making
  • multiscale
  • wide range
  • software engineering
  • genetic algorithm
  • clustering algorithm
  • response time
  • dynamic environments
  • design process
  • process model
  • development process