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Two-dimensional semiconductor device analysis based on new finite-element discretization employing the S-G scheme.

Gen-Lin TanXiao-Li YuanQi-Ming ZhangWalter H. KuAn-Jui Shey
Published in: IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. (1989)
Keyphrases
  • finite element
  • finite element analysis
  • three dimensional
  • finite difference
  • finite element method
  • real time
  • computer vision
  • experimental data
  • soft tissue
  • material properties
  • gpu accelerated