Branch-and-Bound Algorithms for the Test Cover Problem.
Koen M. J. De BontridderB. J. LagewegJan Karel LenstraJames B. OrlinLeen StougiePublished in: ESA (2002)
Keyphrases
- branch and bound algorithm
- branch and bound
- randomly generated
- lower bound
- search tree
- set covering problem
- combinatorial optimization
- haplotype inference
- optimal solution
- boolean satisfiability
- upper bound
- np hard
- combinatorial problems
- variable ordering
- microarray
- orders of magnitude
- evolutionary algorithm
- column generation
- search algorithm
- entropy minimization
- neural network
- finding an optimal solution