Worst-Case Crosstalk Noise Analysis Based on Dual-Exponential Noise Metrics.
Jiaxing SunYun ZhengQing YeTianchun YePublished in: VLSI Design (2005)
Keyphrases
- worst case
- noisy data
- image noise
- signal to noise ratio
- missing data
- data sets
- image structure
- noise reduction
- statistical analysis
- decision trees
- noise free
- random noise
- image analysis
- noise level
- additive noise
- low snr
- short time fourier transform
- noise model
- quantitative analysis
- wavelet transform
- multi class
- case study
- information systems