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Why is SAM Robust to Label Noise?

Christina BaekZico KolterAditi Raghunathan
Published in: CoRR (2024)
Keyphrases
  • label noise
  • active learning
  • noise tolerant
  • noise model
  • error rate
  • image processing
  • decision trees
  • training data
  • lower bound
  • feature vectors
  • maximum likelihood