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Robust ESD self-protected LDNMOSFET by an enhanced displacement-current triggering.
Tzu-Cheng Kao
Chen-Hsin Lien
Chien-Wei Chiu
Jian-Hsing Lee
Yen-Hsiang Lo
Chung-Yu Hung
Tsung-Yi Huang
Hung-Der Su
Published in:
IRPS (2015)
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