Editorial for the Special Issue on Photometric Analysis for Computer Vision.
Peter N. BelhumeurKatsushi IkeuchiEmmanuel PradosStefano SoattoPeter F. SturmPublished in: Int. J. Comput. Vis. (2010)
Keyphrases
- special issue
- computer vision
- ecml pkdd
- ai edam
- image analysis
- statistical analysis
- international journal
- image understanding
- special section
- pattern recognition
- data analysis
- computer graphics
- data mining
- applied intelligence
- image processing
- researchers and practitioners
- image segmentation
- pose estimation
- image features
- expert systems
- object recognition