Low-power weighted random pattern testing.
Xiaodong ZhangWenlei ShanKaushik RoyPublished in: IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. (2000)
Keyphrases
- low power
- low cost
- power consumption
- high speed
- single chip
- high power
- vlsi circuits
- pattern matching
- wireless transmission
- real time
- vlsi architecture
- power reduction
- low power consumption
- digital signal processing
- mixed signal
- gate array
- image sensor
- image processing
- ultra low power
- signal processor
- cmos technology
- power dissipation