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Automation and yield of micron-scale self-assembly processes.

Ehsan SaeediSamuel S. KimJames R. EtzkornDeirdre R. MeldrumBabak A. Parviz
Published in: CASE (2007)
Keyphrases
  • scale space
  • process model
  • stochastic processes
  • database
  • databases
  • metadata
  • decision trees
  • face recognition
  • image structure
  • workflow management systems