An Integrated Approach for Analog Ciruit Testing with a Minmum Number of Detected Parameters.

Mustapha Slamani Bozena Kaminska Guy Quesnel

Published in: ITC (1994)

Keyphrases

small number
computational complexity
signal processing
data sets
neural network
real world
expert systems
evolutionary algorithm
low cost
maximum likelihood
test set
transfer function
maximum number