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A new high-voltage tolerant I/O for improving ESD robustness.
J. T. Jang
Y. C. Kim
W. H. Bong
E. K. Kwon
B. J. Kwon
J. S. Jeon
H. G. Kim
I. H. Son
Published in:
Microelectron. Reliab. (2006)
Keyphrases
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high voltage
operating conditions
normal operation
input output
partial discharge
main memory
real time
genetic algorithm
decision trees
neural network
knowledge base
data structure
small number
case based reasoning
rough sets
file system