Unsupervised fabric defect detection with high-frequency feature mapping.
Da WanCan GaoJie ZhouXinrui ShenLinlin ShenPublished in: Multim. Tools Appl. (2024)
Keyphrases
- high frequency
- feature mapping
- low frequency
- manifold learning
- multiple instance learning
- high resolution
- wavelet transform
- semi supervised
- unsupervised learning
- nonlinear dimensionality reduction
- spam filtering
- feature space
- discrete wavelet transform
- wavelet coefficients
- wavelet decomposition
- subband
- supervised learning
- data sets
- multi class
- image reconstruction
- wavelet domain
- semi supervised learning
- pattern recognition
- multiscale
- high frequency components
- machine learning