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The Spotlight: A General Method for Discovering Systematic Errors in Deep Learning Models.

Greg d'EonJason d'EonJames R. WrightKevin Leyton-Brown
Published in: FAccT (2022)
Keyphrases
  • learning models
  • pairwise
  • feature extraction
  • probabilistic model
  • maximum likelihood
  • classification accuracy
  • segmentation algorithm
  • segmentation method
  • optimization method