Software defect prediction based on stacked sparse denoising autoencoders and enhanced extreme learning machine.
Nana ZhangShi YingKun ZhuDandan ZhuPublished in: IET Softw. (2022)
Keyphrases
- denoising
- extreme learning machine
- software defect prediction
- feedforward neural networks
- support vector regression
- ensemble learning
- feed forward neural networks
- neural network
- image processing
- gaussian processes
- high dimensional
- class imbalance
- variable selection
- support vector machine
- back propagation
- artificial neural networks
- ensemble methods
- hidden layer
- activation function
- bayesian networks
- genetic algorithm