Fast statistical analysis of rare failure events for memory circuits in high-dimensional variation space.
Shupeng SunXin LiPublished in: ASP-DAC (2015)
Keyphrases
- statistical analysis
- high dimensional
- low dimensional
- parameter space
- higher dimensional
- high dimensional spaces
- input space
- rare events
- data points
- space time
- lower dimensional
- event detection
- statistical analyses
- feature space
- incoming data
- clinical data
- metric space
- statistical methods
- human activities
- search space
- variable selection
- sparse data
- dimensional data
- similarity search
- circuit design
- nearest neighbor
- data sets
- low dimensional spaces