Retiming algorithms with application to VLSI testability.
Dimitrios KagarisSpyros TragoudasPublished in: Great Lakes Symposium on VLSI (1994)
Keyphrases
- orders of magnitude
- learning algorithm
- recently developed
- benchmark datasets
- signal processing
- data structure
- significant improvement
- general purpose
- high speed
- computationally efficient
- machine learning algorithms
- information systems
- computer vision
- expert systems
- association rules
- optimization problems
- data mining techniques
- image processing
- data sets