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Metric dimension and metric independence number of incidence graphs of symmetric designs.

Lang TangShenglin ZhouJing ChenZhilin Zhang
Published in: Discret. Appl. Math. (2021)
Keyphrases
  • metric space
  • small number
  • distance measure
  • data sets
  • feature selection
  • memory requirements
  • metric learning
  • maximum number
  • random graphs