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Estimating Regions of Deterioration in Electron Microscope Images of Rubber Materials via a Transfer Learning-Based Anomaly Detection Model.
Ren Togo
Naoki Saito
Takahiro Ogawa
Miki Haseyama
Published in:
IEEE Access (2019)
Keyphrases
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anomaly detection
transfer learning
probabilistic model
negative selection algorithm
information retrieval
data mining
prior knowledge
active learning
labeled data
machine learning algorithms
intrusion detection system
microscope images
detecting anomalies