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Off-state breakdown and leakage current transport analysis of AlGaN/GaN high electron mobility transistors.

Weizong XuLihua FuHai LuDunjun ChenFangfang RenRong ZhangYoudou ZhengKe WeiXinyu Liu
Published in: Microelectron. Reliab. (2014)
Keyphrases
  • image analysis
  • real time
  • image sequences