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VITA: variation-aware interconnect timing analysis for symmetric and skewed sources of variation considering variational ramp input.

Soroush AbbaspourHanif FatemiMassoud Pedram
Published in: ACM Great Lakes Symposium on VLSI (2005)
Keyphrases
  • data mining
  • high speed
  • optical flow
  • input data
  • databases
  • feature selection
  • case study
  • information sources