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On automatic testpoint insertion in sequential circuits.

Harald GundlachKlaus D. Müller-Glaser
Published in: ITC (1990)
Keyphrases
  • semi automatic
  • high speed
  • real time
  • neural network
  • data mining
  • case study
  • image segmentation
  • search algorithm
  • probabilistic model
  • fully automatic
  • analog circuits