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Efficient Exploration of Availability Models Guided by Failure Distances.

Juan A. CarrascoJavier EscribáAngel Calderón
Published in: SIGMETRICS (1996)
Keyphrases
  • modeling framework
  • data mining
  • artificial intelligence
  • computer vision
  • three dimensional
  • distance measure
  • distance function
  • euclidean distance
  • statistical models