Login / Signup

A Study of Transient Voltage Peaking in Diode-Based ESD Protection Structures in 28nm CMOS.

Chenkun WangFeilong ZhangFei LuQi ChenCheng LiAlbert Z. Wang
Published in: IEEE Access (2020)
Keyphrases
  • empirical studies
  • data sets
  • computer simulation
  • power supply
  • high speed
  • statistical analysis
  • power consumption