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Dielectric Relaxation, Aging and Recovery in High-K MIM Capacitors.

Konner E. K. HoldenGavin D. R. HallMichael CookChris KendrickKaitlyn PabstBruce GreenwoodRobin DaughertyJeff P. GambinoDerryl D. J. Allman
Published in: IRPS (2021)
Keyphrases
  • wide range
  • high precision
  • small size
  • data sets
  • databases
  • data mining
  • machine learning
  • multiscale
  • iterative algorithms
  • lognormal distribution